A method to simulate the optical image from far-field scattering numerical data and its application to the total internal reflection microscopy of metallic nanowires

  1. Iglesias, I.
  2. Muñoz, J.
  3. Colchero, J.
Journal:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Year of publication: 2019

Volume: 276

Issue: 1

Pages: 21-26

Type: Article

DOI: 10.1111/JMI.12830 GOOGLE SCHOLAR
Data source: Scopus