A method to simulate the optical image from far-field scattering numerical data and its application to the total internal reflection microscopy of metallic nanowires
- Iglesias, I.
- Muñoz, J.
- Colchero, J.
ISSN: 1365-2818, 0022-2720
Ano de publicación: 2019
Volume: 276
Número: 1
Páxinas: 21-26
Tipo: Artigo