A method to simulate the optical image from far-field scattering numerical data and its application to the total internal reflection microscopy of metallic nanowires

  1. Iglesias, I.
  2. Muñoz, J.
  3. Colchero, J.
Aldizkaria:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Argitalpen urtea: 2019

Alea: 276

Zenbakia: 1

Orrialdeak: 21-26

Mota: Artikulua

DOI: 10.1111/JMI.12830 GOOGLE SCHOLAR
Datuen iturria: Scopus