A method to simulate the optical image from far-field scattering numerical data and its application to the total internal reflection microscopy of metallic nanowires
- Iglesias, I.
- Muñoz, J.
- Colchero, J.
ISSN: 1365-2818, 0022-2720
Datum der Publikation: 2019
Ausgabe: 276
Nummer: 1
Seiten: 21-26
Art: Artikel