Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

  1. Palacios-Lidón, E.
  2. Munuera, C.
  3. Ocal, C.
  4. Colchero, J.
Revue:
Ultramicroscopy

ISSN: 0304-3991

Année de publication: 2010

Volumen: 110

Número: 7

Pages: 789-800

Type: Article

DOI: 10.1016/J.ULTRAMIC.2010.01.015 GOOGLE SCHOLAR

Objectifs de Développement Durable

La source de données: Scopus