Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

  1. Palacios-Lidón, E.
  2. Munuera, C.
  3. Ocal, C.
  4. Colchero, J.
Journal:
Ultramicroscopy

ISSN: 0304-3991

Year of publication: 2010

Volume: 110

Issue: 7

Pages: 789-800

Type: Article

DOI: 10.1016/J.ULTRAMIC.2010.01.015 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus