Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

  1. Somoza, A.M.
  2. Palacios-Lidón, E.
Journal:
Physical Review B

ISSN: 2469-9969,  2469-9950

Year of publication: 2020

Volume: 101

Issue: 7

Type: Article

DOI: 10.1103/PHYSREVB.101.075432 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus