Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

  1. Somoza, A.M.
  2. Palacios-Lidón, E.
Revue:
Physical Review B

ISSN: 2469-9969,  2469-9950

Année de publication: 2020

Volumen: 101

Número: 7

Type: Article

DOI: 10.1103/PHYSREVB.101.075432 GOOGLE SCHOLAR
La source de données: Scopus