Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

  1. Somoza, A.M.
  2. Palacios-Lidón, E.
Aldizkaria:
Physical Review B

ISSN: 2469-9969,  2469-9950

Argitalpen urtea: 2020

Alea: 101

Zenbakia: 7

Mota: Artikulua

DOI: 10.1103/PHYSREVB.101.075432 GOOGLE SCHOLAR
Datuen iturria: Scopus