An Analytical Model for the Calculation of the Expected Miss Ratio in Faulty Caches

  1. Sanchez, Daniel
  2. Sazeides, Yiannakis
  3. Aragon, Juan L.
  4. Garcia, Jose M.
Colección de libros:
2011 IEEE 17TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS)

ISSN: 1942-9398

ISBN: 978-1-4577-1055-1

Ano de publicación: 2011

Congreso: 17th IEEE International On-Line Testing Symposium (IOLTS)

Tipo: Achega congreso

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Fonte de datos: WoS