An Analytical Model for the Calculation of the Expected Miss Ratio in Faulty Caches
- Sanchez, Daniel
- Sazeides, Yiannakis
- Aragon, Juan L.
- Garcia, Jose M.
ISSN: 1942-9398
ISBN: 978-1-4577-1055-1
Datum der Publikation: 2011
Kongress: 17th IEEE International On-Line Testing Symposium (IOLTS)
Art: Konferenz-Beitrag