Arturo M. Baró-rekin lankidetzan egindako argitalpenak (50)

2013

  1. Photobleaching of MEH-PPV thin films: Correlation between optical properties and the nanoscale surface photovoltage

    Solar Energy Materials and Solar Cells, Vol. 117, pp. 15-21

2012

  1. Nanoscale electro-optical properties of organic semiconducting thin films: From individual materials to the blend

    Journal of Physical Chemistry C, Vol. 116, Núm. 33, pp. 17919-17927

2011

  1. Nanoscale surface photovoltage of organic semiconductors with two pass Kelvin probe microscopy

    Nanotechnology, Vol. 22, Núm. 37

  2. Wavelength dependence of nanoscale photodegradation in poly(3- octylthiophene) thin films

    Polymer Degradation and Stability, Vol. 96, Núm. 7, pp. 1279-1285

2007

  1. WSXM: A software for scanning probe microscopy and a tool for nanotechnology

    Review of Scientific Instruments, Vol. 78, Núm. 1

2004

  1. Atomic force microscopy contact, tapping, and jumping modes for imaging biological samples in liquids

    Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 69, Núm. 3 1

  2. Jumping mode atomic force microscopy obtains reproducible images of Alzheimer paired helical filaments in liquids

    European Polymer Journal

2003

  1. DNA height in scanning force microscopy

    Ultramicroscopy, Vol. 96, Núm. 2, pp. 167-174

  2. Electrostatic force gradient signal: Resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopy

    Nanotechnology, Vol. 14, Núm. 2, pp. 332-340

  3. Interaction forces and conduction properties between multi wall carbon nanotube tips and Au(1 1 1)

    Ultramicroscopy, Vol. 96, Núm. 1, pp. 83-92

  4. Jumping mode scanning force microscopy: A suitable technique for imaging DNA in liquids

    Applied Surface Science

  5. Probing electrical transport in nanowires: Current maps of individual V2O5 nanofibres with scanning force microscopy

    Nanotechnology, Vol. 14, Núm. 2, pp. 134-137

  6. Topographic characterization and electrostatic response of M-DNA studied by atomic force microscopy

    Nanotechnology, Vol. 14, Núm. 2, pp. 128-133

2002

  1. Comparison of strain gage and interferometric detection for measurement and control of piezoelectric actuators

    Materials Characterization

  2. Contactless experiments on individual DNA molecules show no evidence for molecular wire behavior

    Proceedings of the National Academy of Sciences of the United States of America, Vol. 99, Núm. 13, pp. 8484-8487

  3. Correction of microrheological measurements of soft samples with atomic force microscopy for the hydrodynamic drag on the cantilever

    Langmuir, Vol. 18, Núm. 3, pp. 716-721

  4. Electrostatic scanning force microscopy images of long molecules: Single-walled carbon nanotubes and DNA

    Nanotechnology

  5. Erratum: Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy (Appl. Phys. Lett. (2002) 80 (1462))

    Applied Physics Letters

  6. Erratum: Visualization of single-walled carbon nanotubes electrical networks by scanning force microspy (Applied Physics Letters (2001) 79 (2979))

    Applied Physics Letters

  7. Nonlinear Resistance versus Length in Single-Walled Carbon Nanotubes

    Physical Review Letters, Vol. 88, Núm. 3, pp. 4