Pablo
Artal Soriano
Catedraticos de Universidad
IBM Research – Almaden
San Jose, EE. UU.IBM Research – Almaden-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
1989
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Image processing enhancement of high-resolution TEM micrographs of nanometer-size metal particles
Ultramicroscopy, Vol. 30, Núm. 3, pp. 405-416