Spherical Aberration and Scattering Compensation in Microscopy Images through a Blind Deconvolution Method
- Bueno, J.M.
- Ávila, F.J.
Konferenzberichte:
Novel Techniques in Microscopy, NTM 2023
ISBN: 9781957171210
Datum der Publikation: 2023
Novel Techniques in Microscopy, NTM 2023
Art: Konferenz-Beitrag