VAASI: Crafting valid and abnormal adversarial samples for anomaly detection systems in industrial scenarios

1. Perales Gómez, A.L.
2. Fernández Maimó, L.
3. Huertas Celdrán, A.
4. García Clemente, F.J.

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DOI: 10.1016/J.JISA.2023.103647 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus