Extending MUD profiles through an automated IoT security testing methodology
- Matheu, S.N.
- Hernandez-Ramos, J.L.
- Perez, S.
- Skarmeta, A.F.
Journal:
IEEE Access
ISSN: 2169-3536
Year of publication: 2019
Volume: 7
Pages: 149444-149463
Type: Article