Localized charge imaging with scanning Kelvin probe microscopy

  1. Orihuela, M.F.
  2. Somoza, A.M.
  3. Colchero, J.
  4. Ortuño, M.
  5. Palacios-Lidón, E.
Journal:
Nanotechnology

ISSN: 1361-6528,  0957-4484

Year of publication: 2017

Volume: 28

Issue: 2

Type: Article

DOI: 10.1088/1361-6528/28/2/025703 GOOGLE SCHOLAR
Data source: Scopus