An analytical model for the calculation of the Expected Miss Ratio in faulty caches

  1. Sánchez, D.
  2. Sazeides, Y.
  3. Aragón, J.L.
  4. García, J.M.
Proceedings:
Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011

ISBN: 9781457710551

Year of publication: 2011

Pages: 252-257

Type: Conference paper

DOI: 10.1109/IOLTS.2011.5994538 GOOGLE SCHOLAR
Data source: Scopus