Nanogoniometry with scanning force microscopy: A model study of CdTe thin films

  1. Palacios-Lidón, E.
  2. Guanter, L.
  3. Zúñiga-Pérez, J.
  4. Muñoz-Sanjosé, V.
  5. Colchero, J.
Revue:
Small

ISSN: 1613-6810 1613-6829

Année de publication: 2007

Volumen: 3

Número: 3

Pages: 474-480

Type: Article

DOI: 10.1002/SMLL.200600469 GOOGLE SCHOLAR